Highest quality standards are achieved through the implementations of latest technology, decades of experience and everlasting moral values , which have helped us to retain our customers as well as multiply them.
WAFER COATINGS
Specific X-ray Fluorescence Measuring Instruments (XRF) for Measurements and Analyses of Coating Thicknesses and Compositions on Wafers
The instruments are particularly suitable for measurements on structures on wafers in the electronics and semiconductor industries, Analysis of very thin coatings, e.g., gold/palladium coatings of ⤠0.1 μm (0.004 mils) & Determination of complex multi-coating systems Automated measurements, e.g., in quality control
* To embrace new technologies and methods. * To give unsurpassed products and services to the clients. * To constantly look for improvement and changes.